Fractal and Lacunarity Analyses: Quantitative Characterization of Hierarchical Surface Topographies. (13th January 2016)

• Record Type: Journal Article
• Authors: Ling, Edwin J. Y.; Servio, Phillip; Kietzig, Anne-Marie
• Is Part Of: Microscopy and microanalysis. Volume 22:Number 1(2016:Feb.)
• Page Start: 168
• Page End: 177
• Publication Date: 2016-01-13
• Subjects: fractal dimension, -- lacunarity, -- texture analysis, -- laser-induced hierarchical surface topographies, -- scanning electron microscopy; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927615015561
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Biomimetic hierarchical surface structures that exhibit features having multiple length scales have been used in many technological and engineering applications. Their surface topographies are most commonly analyzed using scanning electron microscopy (SEM), which only allows for qualitative visual assessments. Here we introduce fractal and lacunarity analyses as a method of characterizing the SEM images of hierarchical surface structures in a quantitative manner. Taking femtosecond laser-irradiated metals as an example, our results illustrate that, while the fractal dimension is a poor descriptor of surface complexity, lacunarity analysis can successfully quantify the spatial texture of an SEM image; this, in turn, provides a convenient means of reporting changes in surface topography with respect to changes in processing parameters. Furthermore, lacunarity plots are shown to be sensitive to the different length scales present within a hierarchical structure due to the reversal of lacunarity trends at specific magnifications where new features become resolvable. Finally, we have established a consistent method of detecting pattern sizes in an image from the oscillation of lacunarity plots. Therefore, we promote the adoption of lacunarity analysis as a powerful tool for quantitative characterization of, but not limited to, multi-scale hierarchical surface topographies.