Stuck-at-close defect propagation and its blocking technique in CMOL cell mapping. (February 2018)

• Record Type: Journal Article
• Authors: Chen, Dingheng; Xia, Yinshui; Wang, Zhongfeng
• Is Part Of: Microelectronics journal. Volume 72(2018)
• Page Start: 100
• Page End: 108
• Publication Date: 2018-02
• Subjects: Defect-tolerant -- Stuck-at-close -- Cell mapping -- CMOS/Nanowire/molecular hybrid (CMOL) -- Evolutionary algorithm (EA); Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2017.12.004
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: CMOS/nanowire/molecular hybrid (CMOL) circuit offers flexible logic function and high density advantages. Since a considerable number of nanodevices are inevitably defective during manufacturing process, the defect-tolerant cell mapping is a critical procedure for logic implementation in CMOL architecture. To the best of our knowledge, there is no effective comprehensive method for defect-tolerant CMOL cell mapping covering both stuck-at open and stuck-at close defects because the mechanism how stuck-at-close defects affect CMOL cell mapping has not been intensively explored. In this paper, stuck-at-close defect is modeled and the defect propagation phenomena in CMOL is analyzed. A propagation blocking method is proposed aiming to improve the success rate of CMOL cell mapping. The proposed blocking method is embedded into a reconfiguration-based evolutionary algorithm (EA) for CMOL cell mapping to verify the feasibility and efficiency. Further, parameter setting is advised to tolerate stuck-at-close defects. Numerical results in comparison with the state-of-the-art works applying to ISCAS benchmarks demonstrate the proposed method improves the efficiency.