Cite
HARVARD Citation
Lim, J. et al. (2018). High performance SONOS flash memory with in-situ silicon nanocrystals embedded in silicon nitride charge trapping layer. Solid-state electronics. pp. 134-138. [Online].
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Lim, J. et al. (2018). High performance SONOS flash memory with in-situ silicon nanocrystals embedded in silicon nitride charge trapping layer. Solid-state electronics. pp. 134-138. [Online].