Cite
HARVARD Citation
Rubino, S. et al. (n.d.). A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Graphene and Graphite Flakes. Microscopy and microanalysis. pp. 250-256. [Online].
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Rubino, S. et al. (n.d.). A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Graphene and Graphite Flakes. Microscopy and microanalysis. pp. 250-256. [Online].