A Review on Leakage Power Reduction Techniques at 45nm Technology. (2015)
- Record Type:
- Journal Article
- Title:
- A Review on Leakage Power Reduction Techniques at 45nm Technology. (2015)
- Main Title:
- A Review on Leakage Power Reduction Techniques at 45nm Technology
- Authors:
- Kumar, N. Praveen
Charles, B. Stephen
Sumalatha, V. - Abstract:
- Abstract: There is a growing need to analyze and optimize the stand-by component of power in digital circuits designed for portable and battery-powered applications like laptops and mobiles. Since these devices remain in stand-by mode significantly longer than in active mode, their stand-by current, and not their active switching current, determines their battery life. Hence, stringent specifications are being placed on the stand-by current drawn by such devices especially at nanometer regime. As the power supply voltage is reduced, the threshold voltage of transistors is scaled down to maintain a constant switching speed. Since reducing the threshold voltage increases the leakage of a device exponentially, leakage current has become a dominant factor in the design of VLSI circuits. In this paper we presented various techniques to reduce the standby power at 45 nm technology.
- Is Part Of:
- Materials today. Volume 2:Number 10(2015)Part A
- Journal:
- Materials today
- Issue:
- Volume 2:Number 10(2015)Part A
- Issue Display:
- Volume 2, Issue 10, Part 1 (2015)
- Year:
- 2015
- Volume:
- 2
- Issue:
- 10
- Part:
- 1
- Issue Sort Value:
- 2015-0002-0010-0001
- Page Start:
- 4569
- Page End:
- 4574
- Publication Date:
- 2015
- Subjects:
- Standby Power -- Tunneling -- Sub-threshold
Materials science -- Congresses -- Periodicals
620.1 - Journal URLs:
- http://www.sciencedirect.com/science/journal/22147853 ↗
http://www.sciencedirect.com/ ↗ - DOI:
- 10.1016/j.matpr.2015.10.074 ↗
- Languages:
- English
- ISSNs:
- 2214-7853
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 5714.xml