Nanostructured oxyspinel multilayers for novel high-efficient conversion and control. (1st January 2014)

• Record Type: Journal Article
• Authors: Hadzaman, I.; Klym, H.; Shpotyuk, O.
• Is Part Of: International journal of nanotechnology. Volume 11:Number 9/10/11(2014)
• Page Start: 843
• Page End: 853
• Publication Date: 2014-01-01
• Subjects: spinel -- nanostructured thick films -- multilayers -- energy conversion -- nanotechnology.; 620.505
• DOI: 10.1504/IJNT.2014.063793
• Languages: English
• ISSNs: 1475-7435

Abstract

Multilayered temperature-/humidity-sensitive thick-film p - i - p + structures based on spinel-type semiconducting ceramics of different chemical composition (Cu 0.1 Ni 0.1 Co 1.6 Mn 1.2 O 4 with p + -type of electrical conductivity and Cu 0.1 Ni 0.8 Co 0.2 Mn 1.9 O 4 with p -type of electrical conductivity) and magnesium aluminate i -type MgAl 2 O 4 ceramics, as well as temperature-sensitive p-p + and p-p + -p structures were prepared and studied. It is shown that increasing the quantity of thick-film layers (from two to three) results in the improvement of the temperature sensitivity of thick-film structures. Humidity-sensitive thick films in one-layered form possess good linear dependence of electrical resistance on relative humidity without hysteresis in the range of 40–99%. Integrated p-i-p + thick-film structures are stable in time and can be successfully applied for integrated environmental sensors. In addition, anomalous proton charge-transfer processes were studied for the first time in these p-i-p + multilayers as a basis for novel electrical power sources, energy conversion and storage distinguished by high functional reliability, technological reproducibility and cost-effective synthesis route. A so-called aqueous-voltaic effect was revealed as electric motion force generation caused by orientation influence of electrical fields within separate p-i and i-p+ bilayers. This effect is strongly dependent on technical parameters of p-i-p + nanostructure, reaching approximately 0.2 V for typical thick-film depths.