Cite
HARVARD Citation
Herrera, R. et al. (n.d.). Structural, compositional and electrical characterization of Si-rich SiOx layers suitable for application in light sensors. Materials science in semiconductor processing. pp. 229-234. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Herrera, R. et al. (n.d.). Structural, compositional and electrical characterization of Si-rich SiOx layers suitable for application in light sensors. Materials science in semiconductor processing. pp. 229-234. [Online].