Cite
HARVARD Citation
Pin, S. et al. (2017). Combined creep characterisation from single lap shear tests and 3D implementation for fatigue simulations. Microelectronics and reliability. pp. 368-372. [Online].
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Pin, S. et al. (2017). Combined creep characterisation from single lap shear tests and 3D implementation for fatigue simulations. Microelectronics and reliability. pp. 368-372. [Online].