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HARVARD Citation
Pribahsnik, F. et al. (2017). Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectronics and reliability. pp. 304-308. [Online].
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Pribahsnik, F. et al. (2017). Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectronics and reliability. pp. 304-308. [Online].