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HARVARD Citation
Ceccarelli, L. et al. (2017). A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. Microelectronics and reliability. pp. 272-276. [Online].
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Ceccarelli, L. et al. (2017). A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. Microelectronics and reliability. pp. 272-276. [Online].