Cite
HARVARD Citation
Reigosa, P. et al. (2017). Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectronics and reliability. pp. 485-489. [Online].
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Reigosa, P. et al. (2017). Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectronics and reliability. pp. 485-489. [Online].