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HARVARD Citation
Moultif, N. et al. (2017). Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures. Microelectronics and reliability. pp. 243-248. [Online].
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Moultif, N. et al. (2017). Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures. Microelectronics and reliability. pp. 243-248. [Online].