Cite
HARVARD Citation
Calienes, W. et al. (2017). Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectronics and reliability. pp. 655-659. [Online].
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Calienes, W. et al. (2017). Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectronics and reliability. pp. 655-659. [Online].