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HARVARD Citation
Ruffilli, R. et al. (2017). Mechanisms of power module source metal degradation during electro-thermal aging. Microelectronics and reliability. pp. 507-511. [Online].
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Ruffilli, R. et al. (2017). Mechanisms of power module source metal degradation during electro-thermal aging. Microelectronics and reliability. pp. 507-511. [Online].