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HARVARD Citation
Moindjie, S. et al. (2017). Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. Microelectronics and reliability. pp. 53-57. [Online].
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Moindjie, S. et al. (2017). Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. Microelectronics and reliability. pp. 53-57. [Online].