Cite
HARVARD Citation
Tung, H. et al. (2015). Microstructures, mechanical properties and oxidation behavior of vacuum annealed TiZrN thin films. Vacuum. pp. 12-18. [Online].
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Tung, H. et al. (2015). Microstructures, mechanical properties and oxidation behavior of vacuum annealed TiZrN thin films. Vacuum. pp. 12-18. [Online].