A compact and versatile tender X‐ray single‐shot spectrometer for online XFEL diagnostics. (6th December 2017)

• Record Type: Journal Article
• Authors: Rehanek, Jens; Milne, Christopher J.; Szlachetko, Jakub; Czapla-Masztafiak, Joanna; Schneider, Jörg; Huthwelker, Thomas; Borca, Camelia N.; Wetter, Reto; Patthey, Luc; Juranić, Pavle
• Is Part Of: Journal of synchrotron radiation. Volume 25:Part 1(2018)
• Page Start: 16
• Page End: 19
• Publication Date: 2017-12-06
• Subjects: free‐electron laser -- tender X‐ray spectroscopy -- single‐shot measurement; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577517012796
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A single‐shot spectrometer for the tender X‐ray range is presented, based on the von Hamos geometry and using elastic scattering as a fingerprint of the XFEL‐produced spectrum. Abstract : One of the remaining challenges for accurate photon diagnostics at X‐ray free‐electron lasers (FELs) is the shot‐to‐shot, non‐destructive, high‐resolution characterization of the FEL pulse spectrum at photon energies between 2 keV and 4 keV, the so‐called tender X‐ray range. Here, a spectrometer setup is reported, based on the von Hamos geometry and using elastic scattering as a fingerprint of the FEL‐generated spectrum. It is capable of pulse‐to‐pulse measurement of the spectrum with an energy resolution (Δ E / E ) of 10 −4, within a bandwidth of 2%. The Tender X‐ray Single‐Shot Spectrometer (TXS) will grant to experimental scientists the freedom to measure the spectrum in a single‐shot measurement, keeping the transmitted beam undisturbed. It will enable single‐shot reconstructions for easier and faster data analysis.