Cite
HARVARD Citation
Wu, Z. et al. (2018). Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods. Surface and interface analysis. pp. 117-122. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Wu, Z. et al. (2018). Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods. Surface and interface analysis. pp. 117-122. [Online].