Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits. (January 2018)

• Record Type: Journal Article
• Authors: Possamai Bastos, Rodrigo; Guimarães, Leonel Acunha; Sill Torres, Frank; Fesquet, Laurent
• Is Part Of: Microelectronics journal. Volume 71(2017)
• Page Start: 70
• Page End: 79
• Publication Date: 2018-01
• Subjects: Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2017.11.006
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: Today's integrated circuits are liable to operate under transient faults created either by radiation or malicious sources of perturbation. Among the many techniques for the detection of transient faults, Bulk Built-In Current Sensors (BBICS) present attractive low-cost and efficient features for the protection of circuits. This article provides a survey of published BBICS architectures and compares them with regard to their sensitivities in detecting transient faults. Moreover, a new dynamic BBICS architecture is introduced with improved detection sensitivity, negligible power consumption, and reduced area overhead.