Approximate calculation of triboelectric charge density (σ) of nanoscale contact electrification. Issue 183 (2nd September 2017)

• Record Type: Journal Article
• Authors: Ha, J.; Kim, S. M.; Kim, J.-B.
• Is Part Of: Integrated ferroelectrics. Issue 183(2017)
• Page Start: 171
• Page End: 175
• Publication Date: 2017-09-02
• Subjects: Triboelectric charge density -- surface density of states -- work function difference -- dielectric constant -- dielectric thickness; Ferroelectric devices -- Periodicals; Integrated circuits -- Periodicals; 537.244805
• DOI: 10.1080/10584587.2017.1376993
• Languages: English
• ISSNs: 1058-4587

Abstract

ABSTRACT: We have analytically approximated the triboelectric charge densities generated by triboelectrification reaching equilibrium over time in contact-mode TENG. It is assumed that the surface density of states (SDOS), Ns ( E ) is constant. The amount of electron transfer at the interface is estimated by calculating the change in vacuum energy level due to the charge density induced in the upper metal electrode and the lower metal electrode within the nanoscale separation range. Numerical results show that Ns ( E ) and work function difference are dominant compared to dielectric constant (material property) and dielectric thickness (structure parameter).