Cite
HARVARD Citation
Janssens, E. et al. (n.d.). Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection. Case studies in nondestructive testing and evaluation. pp. 14-20. [Online].
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Janssens, E. et al. (n.d.). Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection. Case studies in nondestructive testing and evaluation. pp. 14-20. [Online].