Cite
HARVARD Citation
Sahoo, S. et al. (2017). 50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications. Surface and interface analysis. pp. 1279-1286. [Online].
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Sahoo, S. et al. (2017). 50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications. Surface and interface analysis. pp. 1279-1286. [Online].