Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters. Issue 46 (21st November 2017)

• Record Type: Journal Article
• Authors: Xiang, Yepeng; Zhao, Yongbiao; Xu, Nan; Gong, Shaolong; Ni, Fan; Wu, Kailong; Luo, Jiajia; Xie, Guohua; Lu, Zheng-Hong; Yang, Chuluo
• Is Part Of: Journal of materials chemistry. Volume 5:Issue 46(2017)
• Page Start: 12204
• Page End: 12210
• Publication Date: 2017-11-21
• Subjects: Materials -- Periodicals; Chemistry, Analytic -- Periodicals; Optical materials -- Research -- Periodicals; Electronics -- Materials -- Research -- Periodicals; 543.0284
• DOI: 10.1039/c7tc04181k
• Languages: English
• ISSNs: 2050-7526

Abstract

Abstract : A halogenating electron acceptor is demonstrated as a feasible strategy for shortening emissive lifetimes while improving the fluorescence efficiency of TADF emitters. Abstract : Halogenation of an electron acceptor in TADF emitters is presented as a feasible strategy for shortening the DF lifetimes of TADF emitters without sacrificing their photoluminescence quantum yields. A greenish-yellow device based on the chloride-substituted emitter (ClPPM ) achieves a high external quantum efficiency of 22.2% and an ultra-slow efficiency roll-off of 12.3% at a practical luminance of 1000 cd m −2, which is comparable to the state-of-the-art device performance for green-to-yellow TADF OLEDs at the practical luminance.