A novel technique for online monitoring of photovoltaic devices degradation. (December 2017)

• Record Type: Journal Article
• Authors: Faba, Antonio; Gaiotto, Stefano; Lozito, Gabriele Maria
• Is Part Of: Solar energy. Volume 158(2017)
• Page Start: 520
• Page End: 527
• Publication Date: 2017-12
• Subjects: Solar energy -- Modeling -- PV degradation -- Five parameters model -- One Diode model; Solar energy -- Periodicals; Solar engines -- Periodicals; 621.47
• DOI: 10.1016/j.solener.2017.10.015
• Languages: English
• ISSNs: 0038-092X

Abstract

Highlights: A methodology to evaluate the progressive degradation of a photovoltaic device is presented. The method is based on the One-Diode model for PV devices. By using a pseudo-analytic algorithm to identify the model, higher precision is achieved. The model use an analytic expression to compute solar irradiance, requiring no change in the operating point of the device. Abstract: A novel methodology to assess the degradation of a photovoltaic module is presented. The degradation of the module can be represented by a progressive alteration of the equivalent One-Diode circuit model for the device. The involved circuit elements are the series and shunt resistances. It is possible to estimate the alterations for these elements by measuring the divergence between the model and the device behaviour. Two novelties are the key aspects of this work. First, the model is identified through a very accurate procedure. Second, the irradiance is estimated directly by means of the photovoltaic device, without need for additional sensors. The result is a completely on-line estimation of the module degradation that does not require any change in the operating point.