Data-fusion of high resolution X-ray CT, SEM and EDS for 3D and pseudo-3D chemical and structural characterization of sandstone. (July 2015)
- Record Type:
- Journal Article
- Title:
- Data-fusion of high resolution X-ray CT, SEM and EDS for 3D and pseudo-3D chemical and structural characterization of sandstone. (July 2015)
- Main Title:
- Data-fusion of high resolution X-ray CT, SEM and EDS for 3D and pseudo-3D chemical and structural characterization of sandstone
- Authors:
- De Boever, Wesley
Derluyn, Hannelore
Van Loo, Denis
Van Hoorebeke, Luc
Cnudde, Veerle - Abstract:
- Highlights: We describe a workflow for multi-scale 3D analysis of rock samples. Using X-ray computed tomography and SEM-EDS, structure and composition is analyzed. Image registration is used to combine the different 2D and 3D methods. The method enables users to know the exact 3D location of subsamples. A combination of CT and SEM ads an extra dimension to compositional EDS maps. Abstract: When dealing with the characterization of the structure and composition of natural stones, problems of representativeness and choice of analysis technique almost always occur. Since feature-sizes are typically spread over the nanometer to centimeter range, there is never one single technique that allows a rapid and complete characterization. Over the last few decades, high resolution X-ray CT (μ-CT) has become an invaluable tool for the 3D characterization of many materials, including natural stones. This technique has many important advantages, but there are also some limitations, including a tradeoff between resolution and sample size and a lack of chemical information. For geologists, this chemical information is of importance for the determination of minerals inside samples. We suggest a workflow for the complete chemical and structural characterization of a representative volume of a heterogeneous geological material. This workflow consists of combining information derived from CT scans at different spatial resolutions with information from scanning electron microscopy andHighlights: We describe a workflow for multi-scale 3D analysis of rock samples. Using X-ray computed tomography and SEM-EDS, structure and composition is analyzed. Image registration is used to combine the different 2D and 3D methods. The method enables users to know the exact 3D location of subsamples. A combination of CT and SEM ads an extra dimension to compositional EDS maps. Abstract: When dealing with the characterization of the structure and composition of natural stones, problems of representativeness and choice of analysis technique almost always occur. Since feature-sizes are typically spread over the nanometer to centimeter range, there is never one single technique that allows a rapid and complete characterization. Over the last few decades, high resolution X-ray CT (μ-CT) has become an invaluable tool for the 3D characterization of many materials, including natural stones. This technique has many important advantages, but there are also some limitations, including a tradeoff between resolution and sample size and a lack of chemical information. For geologists, this chemical information is of importance for the determination of minerals inside samples. We suggest a workflow for the complete chemical and structural characterization of a representative volume of a heterogeneous geological material. This workflow consists of combining information derived from CT scans at different spatial resolutions with information from scanning electron microscopy and energy-dispersive X-ray spectroscopy. … (more)
- Is Part Of:
- Micron. Volume 74(2015:Jul.)
- Journal:
- Micron
- Issue:
- Volume 74(2015:Jul.)
- Issue Display:
- Volume 74 (2015)
- Year:
- 2015
- Volume:
- 74
- Issue Sort Value:
- 2015-0074-0000-0000
- Page Start:
- 15
- Page End:
- 21
- Publication Date:
- 2015-07
- Subjects:
- X-ray tomography -- μ-CT -- Scanning electron microscopy -- Energy-dispersive spectroscopy -- Data fusion
Microscopy -- Periodicals
Electron Probe Microanalysis -- Periodicals
Microscopy -- Periodicals
Microscopie -- Périodiques
Microscopy
Periodicals
502.82 - Journal URLs:
- http://www.elsevier.com/homepage/elecserv.htt ↗
http://www.sciencedirect.com/science/journal/09684328 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.micron.2015.04.003 ↗
- Languages:
- English
- ISSNs:
- 0968-4328
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5759.300000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 5399.xml