Revealing Minor Electrical Losses in the Interconnecting Layers of Organic Tandem Solar Cells. Issue 21 (28th August 2017)

• Record Type: Journal Article
• Authors: Prosa, Mario; Li, Ning; Gasparini, Nicola; Bolognesi, Margherita; Seri, Mirko; Muccini, Michele; Brabec, Christoph J.
• Is Part Of: Advanced materials interfaces. Volume 4:Issue 21(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-08-28
• Subjects: electrical losses -- electroluminescence -- interconnecting layers -- organic tandem solar cells -- photo‐generated current; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.201700776
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract: The interconnection layer (ICL) of organic multijunction solar cells represents one of the most delicate parts to ensure an efficient device operation. In view of pushing the efficiencies toward the theoretical limit, the individuation of minor losses affecting the ICL operation is of crucial importance. However, the difficulties arising from its position within the complex device structure typically hamper an accurate and selective investigation of the ICL. Here, a method based on the analysis of the photo‐generated current density–voltage ( J ph – V ) response of solar cells, in the region of bias over the open‐circuit voltage, is proved to individuate minor electrical losses within the ICL. Interestingly, the proposed method is demonstrated to effectively operate on tandem substructures, where different ICLs are investigated through the combination of materials having diverse characteristics. Furthermore, the use of a complementary investigation technique based on electroluminescence (EL) analysis allows to distinguish the specific nature of the electrical losses. The combination of J ph – V and EL analyses represents an elegant and advanced approach to shed light on the quality of ICLs in tandem substructures by avoiding the fabrication of the more complex tandem architecture. Abstract : To exploit the full potential of organic multijunction solar cells, minor electrical losses affecting the interconnection layer need to be individuated and addressed. The combination of electroluminescence analyses and the photo‐generated current density–voltage response of tandem substructures is proven to identify the presence and the specific nature of minor electrical losses exclusively present in the interconnecting layers.