Atomic‐Scale Structure and Properties of Epitaxial PbZr0.2Ti0.8O3/SrRuO3 Heterointerfaces. Issue 8 (21st April 2015)

• Record Type: Journal Article
• Authors: Mi, Shao‐Bo; Jia, Chun‐Lin; Vrejoiu, Ionela; Alexe, Marin; Hesse, Dietrich
• Is Part Of: Advanced materials interfaces. Volume 2:Issue 8(2015)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2015-04-21
• Subjects: aberration‐corrected electron microscopy -- domain structure -- ferroelectric films -- interface; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.201500087
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract : The depolarization effect at the interfaces between PbZr0.2 Ti0.8 O3 and SrRuO3 film layers and 180° domains in the PbZr0.2 Ti0.8 O3 film layer are characterized, demonstrating that the polarization bound charges induced at the interfaces are not completely compensated by the charge carriers in the SrRuO3 electrode layer. Chemical intermixture at interfaces may have a role in incompletely compensating the bound charges.