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HARVARD Citation
Aouassa, M. et al. (2017). Analysis of composition and microstructures of Ge grown on porous silicon using Raman spectroscopy and transmission electron microscopy. Superlattices and microstructures. pp. 493-498. [Online].
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Aouassa, M. et al. (2017). Analysis of composition and microstructures of Ge grown on porous silicon using Raman spectroscopy and transmission electron microscopy. Superlattices and microstructures. pp. 493-498. [Online].