Cite
HARVARD Citation
Latry, O. et al. (2018). Failure investigation of packaged SiC-diodes after thermal storage in extreme operating condition. Engineering failure analysis. pp. 185-192. [Online].
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Latry, O. et al. (2018). Failure investigation of packaged SiC-diodes after thermal storage in extreme operating condition. Engineering failure analysis. pp. 185-192. [Online].