Design and performance of an X‐ray scanning microscope at the Hard X‐ray Nanoprobe beamline of NSLS‐II. (4th October 2017)

• Record Type: Journal Article
• Authors: Nazaretski, E.; Yan, H.; Lauer, K.; Bouet, N.; Huang, X.; Xu, W.; Zhou, J.; Shu, D.; Hwu, Y; Chu, Y. S.
• Is Part Of: Journal of synchrotron radiation. Volume 24:Part 6(2017)
• Page Start: 1113
• Page End: 1119
• Publication Date: 2017-10-04
• Subjects: X‐ray microscopy -- multilayer Laue lenses -- nanoprobes; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577517011183
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A multilayer Laue lenses based X‐ray scanning microscope installed at the Nanoprobe beamline of the National Synchrotron Light Source II is described. Abstract : A hard X‐ray scanning microscope installed at the Hard X‐ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.