Comparison of the characteristic properties of reduced graphene oxides synthesized from natural graphites with different graphitization degrees. Issue 82 (13th November 2017)

• Record Type: Journal Article
• Authors: Jiao, Xuan; Qiu, Yangshuai; Zhang, Lingyan; Zhang, Xudong
• Is Part Of: RSC advances. Volume 7:Issue 82(2017)
• Page Start: 52337
• Page End: 52344
• Publication Date: 2017-11-13
• Subjects: Chemistry -- Periodicals; 540.5
• DOI: 10.1039/c7ra10809e
• Languages: English
• ISSNs: 2046-2069

Abstract

Abstract : Graphites with a low degree of graphitization are more appropriate to prepare thin layer graphene with a high degree of defects and high specific capacitance. Abstract : In this study, an investigation on the characterization of reduced graphene oxides (rGOs) prepared from natural graphites with different graphitization degrees using Hummers method was conducted. X-ray diffraction, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, Raman spectroscopy, atomic force microscopy and electrochemical performance were performed to characterize the as-prepared graphene oxides (GOs) and rGOs. The results demonstrate that graphites with a lower graphitization degree are more easily oxidized due to the active carbon atoms exposed on their edges and the effective diffusion of oxidants that intercalate into the graphitic layers. In addition, graphites with a low graphitization degree were more suitable for the synthesis of thin layer graphene with a high defect degree and small size in the in-plane sp 2 domains as well as a relatively high specific capacitance.