Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials. (27th October 2017)

Record Type:: Journal Article
Title:: Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials. (27th October 2017)
Main Title:: Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
Authors:: Findlay, Scott D.
Shibata, Naoya
Ikuhara, Yuichi
Huang, Rong
Okunishi, Eiji
Sawada, Hidetaka
Kohno, Yuji
Kondo, Yukihito
Abstract:
Is Part Of:: Microscopy today. Volume 25:Number 6(2017)
Journal:: Microscopy today
Issue:: Volume 25:Number 6(2017)
Issue Display:: Volume 25, Issue 6 (2017)
Year:: 2017
Volume:: 25
Issue:: 6
Issue Sort Value:: 2017-0025-0006-0000
Page Start:: 36
Page End:: 41
Publication Date:: 2017-10-27
Subjects:: Microscope and microscopy -- Periodicals
502.8
Journal URLs:: http://www.microscopy-today.com/ ↗
https://academic.oup.com/mt ↗
http://journals.cambridge.org/action/displayJournal?jid=MTO ↗
http://www.microscopy-today.com/jsp/mto/common/home.faces ↗
DOI:: 10.1017/S1551929517001006 ↗
Languages:: English
ISSNs:: 1551-9295
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 5253.xml