Generalized Tobit models: diagnostics and application in econometrics. Issue 1 (2nd January 2018)
- Record Type:
- Journal Article
- Title:
- Generalized Tobit models: diagnostics and application in econometrics. Issue 1 (2nd January 2018)
- Main Title:
- Generalized Tobit models: diagnostics and application in econometrics
- Authors:
- Barros, Michelli
Galea, Manuel
Leiva, Víctor
Santos-Neto, Manoel - Abstract:
- ABSTRACT: The standard Tobit model is constructed under the assumption of a normal distribution and has been widely applied in econometrics. Atypical/extreme data have a harmful effect on the maximum likelihood estimates of the standard Tobit model parameters. Then, we need to count with diagnostic tools to evaluate the effect of extreme data. If they are detected, we must have available a Tobit model that is robust to this type of data. The family of elliptically contoured distributions has the Laplace, logistic, normal and Student-t cases as some of its members. This family has been largely used for providing generalizations of models based on the normal distribution, with excellent practical results. In particular, because the Student-t distribution has an additional parameter, we can adjust the kurtosis of the data, providing robust estimates against extreme data. We propose a methodology based on a generalization of the standard Tobit model with errors following elliptical distributions. Diagnostics in the Tobit model with elliptical errors are developed. We derive residuals and global/local influence methods considering several perturbation schemes. This is important because different diagnostic methods can detect different atypical data. We implement the proposed methodology in anR package. We illustrate the methodology with real-world econometrical data by using theR package, which shows its potential applications. The Tobit model based on the Student- t distributionABSTRACT: The standard Tobit model is constructed under the assumption of a normal distribution and has been widely applied in econometrics. Atypical/extreme data have a harmful effect on the maximum likelihood estimates of the standard Tobit model parameters. Then, we need to count with diagnostic tools to evaluate the effect of extreme data. If they are detected, we must have available a Tobit model that is robust to this type of data. The family of elliptically contoured distributions has the Laplace, logistic, normal and Student-t cases as some of its members. This family has been largely used for providing generalizations of models based on the normal distribution, with excellent practical results. In particular, because the Student-t distribution has an additional parameter, we can adjust the kurtosis of the data, providing robust estimates against extreme data. We propose a methodology based on a generalization of the standard Tobit model with errors following elliptical distributions. Diagnostics in the Tobit model with elliptical errors are developed. We derive residuals and global/local influence methods considering several perturbation schemes. This is important because different diagnostic methods can detect different atypical data. We implement the proposed methodology in anR package. We illustrate the methodology with real-world econometrical data by using theR package, which shows its potential applications. The Tobit model based on the Student- t distribution with a small quantity of degrees of freedom displays an excellent performance reducing the influence of extreme cases in the maximum likelihood estimates in the application presented. It provides new empirical evidence on the capabilities of the Student-t distribution for accommodation of atypical data. … (more)
- Is Part Of:
- Journal of applied statistics. Volume 45:Issue 1(2018)
- Journal:
- Journal of applied statistics
- Issue:
- Volume 45:Issue 1(2018)
- Issue Display:
- Volume 45, Issue 1 (2018)
- Year:
- 2018
- Volume:
- 45
- Issue:
- 1
- Issue Sort Value:
- 2018-0045-0001-0000
- Page Start:
- 145
- Page End:
- 167
- Publication Date:
- 2018-01-02
- Subjects:
- Cook distance -- elliptically contoured distributions -- labor supply data -- local influence method -- maximum likelihood method -- R software -- residuals -- Student-t distribution
62J05 -- 62J20 -- 62H10
Statistics -- Periodicals
519.5 - Journal URLs:
- http://www.tandfonline.com/loi/cjas20 ↗
http://www.tandfonline.com/ ↗ - DOI:
- 10.1080/02664763.2016.1268572 ↗
- Languages:
- English
- ISSNs:
- 0266-4763
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4947.110000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 5151.xml