Persistence of the orthorhombic phase in YMnO3 hexagonal thin films. Issue 1 (31st August 2016)

• Record Type: Journal Article
• Authors: Romaguera-Barcelay, Y.; Moreira, J. Agostinho; Almeida, A.; Tavares, P. B.; Fernandes, L.; Pérez de la Cruz, J.
• Is Part Of: Ferroelectrics. Volume 498:Issue 1(2016)
• Page Start: 80
• Page End: 84
• Publication Date: 2016-08-31
• Subjects: Multiferroic -- thin films -- symmetry -- strain effect; Ferroelectricity -- Periodicals; Ferroelectric crystals -- Periodicals; 537
• DOI: 10.1080/00150193.2016.1168211
• Languages: English
• ISSNs: 0015-0193

Abstract

ABSTRACT: YMnO3 thin films were prepared based on a chemical solution deposition route. Their structure was studied as a function of the annealing temperature using X-ray diffraction, Raman spectroscopy, and electron backscatter diffraction. For annealing temperatures above 850°C the films, though crystallizing predominantly in a P63 cm hexagonal structure, exhibit a thin Pnma orthorhombic phase close to the film-substrate interface. It is shown that the residual orthorhombic structure is associated with a substrate induced strain state, characterized by an expansion in the in-plane a direction, and a compression in the out of plain c direction.