In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. (August 2014) - Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi