Drop-out model optimization on degraded DNA samples. (December 2015)

• Record Type: Journal Article
• Authors: Duchamp, V.; Bastisch, I.; Schneider, P.M.
• Is Part Of: Forensic science international. Volume 5(2015)
• Page Start: e370
• Page End: e372
• Publication Date: 2015-12
• Subjects: Locus drop-out -- Generalized linear mixed model (GLMM) -- Degraded DNA; Forensic genetics -- Periodicals; Forensic Genetics -- Periodicals; Electronic journals; 614.1
• DOI: 10.1016/j.fsigss.2015.09.147
• Languages: English
• ISSNs: 1875-1768

Abstract

Abstract: Two statistical models have been developed to interpret locus drop-out resulting from degraded DNA samples. These models are based on an experimental dataset of 600 genotyping experiments. The first model presents the probability of locus drop-out against the average peak height with a lower and upper confidence interval. For a given peak height average, the probability of drop-out can be quite wide. This probability decreases rapidly when the profile quality increases. For the second model, we have fitted the probability of locus drop-out against the number of base pairs with a lower and upper confidence interval. The probability of drop-out is increasing along with the number of base pairs. Despite DNA degradation effects, the drop-out probability does not get higher than 0.5.