Room temperature plasticity in thermally grown sub-micron oxide scales revealed by micro-cantilever bending. (February 2018)

• Record Type: Journal Article
• Authors: Iyer, Anand H.S.; Stiller, Krystyna; Colliander, Magnus Hörnqvist
• Is Part Of: Scripta materialia. Number 144(2018)
• Page Start: 9
• Page End: 12
• Publication Date: 2018-02
• Subjects: Focused ion beam (FIB) -- Scanning electron microscopy (SEM) -- Crystalline oxides -- Plastic deformation -- Micro-mechanical testing; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2017.09.036
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: We propose a new geometry for focused ion beam milled micro-cantilevers, which allows production of residual stress-free, isolated thin film specimens from film-substrate systems. This geometry was used to demonstrate the presence of permanent deformation in about 200 nm thick thermally grown oxide scales on a Ni-base superalloy, after applying large bending displacements in-situ in a scanning electron microscope. Stiffness measurements performed before and after the bending tests confirmed the absence of micro-cracks, leading to the conclusion that plastic deformation occurred in the oxide scale. The proposed method is extendable to other film-substrate systems and testing conditions, like non-ambient temperatures. Graphical abstract: