Cite
HARVARD Citation
Lenrick, F. et al. (n.d.). FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. Microscopy and microanalysis. pp. 133-140. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Lenrick, F. et al. (n.d.). FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. Microscopy and microanalysis. pp. 133-140. [Online].