In Situ Biasing of Tapered Si-Ge NW Heterojunctions using Off-Axis Electron Holography. (August 2014) - Gan, Z.; Perea, D.; He, Y.; Colby, R.; Gu, M.; Jinkyoung, Y.; Wang, C.; Picraux, S. T.; Smith, D. J.; McCartney, M. R.