Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope. (22nd May 2014)

• Record Type: Journal Article
• Authors: Zaluzec, Nestor J.
• Is Part Of: Microscopy and microanalysis. Volume 20:Number 4(2014:Aug.)
• Page Start: 1318
• Page End: 1326
• Publication Date: 2014-05-22
• Subjects: solid angle, -- XEDS, -- microanalysis, -- STEM, -- TEM, -- SEM, -- SDD, -- SiLi, -- X-ray detectors, -- EDS, -- EDXS; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927614000956
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Closed form analytical equations used to calculate the collection solid angle of six common geometries of solid-state X-ray detectors in scanning and scanning/transmission analytical electron microscopy are presented. Using these formulae one can make realistic comparisons of the merits of the different detector geometries in modern electron column instruments. This work updates earlier formulations and adds new detector configurations.