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Grimley, E. et al. (n.d.). Application of the Projective Standard Deviation to STEM Imaging and Analysis. Microscopy and microanalysis. pp. 118-119. [Online].
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Grimley, E. et al. (n.d.). Application of the Projective Standard Deviation to STEM Imaging and Analysis. Microscopy and microanalysis. pp. 118-119. [Online].