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HARVARD Citation
Marcott, C. et al. (n.d.). Nanoscale Organic Defect Characterization with AFM-IR. Microscopy and microanalysis. pp. 2056-2057. [Online].
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Marcott, C. et al. (n.d.). Nanoscale Organic Defect Characterization with AFM-IR. Microscopy and microanalysis. pp. 2056-2057. [Online].