3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam. (August 2014) - Man, Xin; Asahata, Tatsuya; Uemoto, Atsushi; Susuki, Hidekazu; Suzuki, Hiroyuki; Hasuda, Masakatsu; Fujii, Toshiaki