Oxide Wizard: An EELS Application to Characterize the White Lines of Transition Metal Edges. (22nd April 2014)

• Record Type: Journal Article
• Authors: Yedra, Lluís; Xuriguera, Elena; Estrader, Marta; López-Ortega, Alberto; Baró, Maria D.; Nogués, Josep; Roldan, Manuel; Varela, Maria; Estradé, Sònia; Peiró, Francesca
• Is Part Of: Microscopy and microanalysis. Volume 20(2014)Supplement 3
• Page Start: 698
• Page End: 705
• Publication Date: 2014-04-22
• Subjects: EELS, -- spectrum image, -- transition metal oxides, -- oxidation state, -- Digital Micrograph script, -- manganese oxide; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927614000440
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Physicochemical properties of transition metal oxides are directly determined by the oxidation state of the metallic cations. To address the increasing need to accurately evaluate the oxidation states of transition metal oxide systems at the nanoscale, here we present "Oxide Wizard." This script for Digital Micrograph characterizes the energy-loss near-edge structure and the position of the transition metal edges in the electron energy-loss spectrum. These characteristics of the edges can be linked to the oxidation states of transition metals with high spatial resolution. The power of the script is demonstrated by mapping manganese oxidation states in Fe3 O4 /Mn3 O4 core/shell nanoparticles with sub-nanometer resolution in real space.