About the contrast of δ' precipitates in bulk Al–Cu–Li alloys in reflection mode with a field‐emission scanning electron microscope at low accelerating voltage. (1st June 2017)
- Record Type:
- Journal Article
- Title:
- About the contrast of δ' precipitates in bulk Al–Cu–Li alloys in reflection mode with a field‐emission scanning electron microscope at low accelerating voltage. (1st June 2017)
- Main Title:
- About the contrast of δ' precipitates in bulk Al–Cu–Li alloys in reflection mode with a field‐emission scanning electron microscope at low accelerating voltage
- Authors:
- BRODUSCH, NICOLAS
VOISARD, FRÉDÉRIC
GAUVIN, RAYNALD - Abstract:
- Summary: Characterising the impact of lithium additions in the precipitation sequence in Al–Li–Cu alloys is important to control the strengthening of the final material. Since now, transmission electron microscopy (TEM) at high beam voltage has been the technique of choice to monitor the size and spatial distribution of δ' precipitates (Al3 Li). Here we report on the imaging of the δ' phase in such alloys using backscattered electrons (BSE) and low accelerating voltage in a high‐resolution field‐emission scanning electron microscope. By applying low‐energy Ar + ion milling to the surface after mechanical polishing (MP), the MP‐induced corroded layers were efficiently removed and permitted the δ's to be visible with a limited impact on the observed microstructure. The resulting BSE contrast between the δ's and the Al matrix was compared with that obtained using Monte Carlo modelling. The artefacts possibly resulting from the sample preparation procedure were reviewed and discussed and permitted to confirm that these precipitates were effectively the metastable δ's. The method described in this report necessitates less intensive sample preparation than that required for TEM and provides a much larger field of view and an easily interpretable contrast compared to the transmission techniques.
- Is Part Of:
- Journal of microscopy. Volume 268:Part 2(2017)
- Journal:
- Journal of microscopy
- Issue:
- Volume 268:Part 2(2017)
- Issue Display:
- Volume 268, Issue 2, Part 2 (2017)
- Year:
- 2017
- Volume:
- 268
- Issue:
- 2
- Part:
- 2
- Issue Sort Value:
- 2017-0268-0002-0002
- Page Start:
- 107
- Page End:
- 118
- Publication Date:
- 2017-06-01
- Subjects:
- Backscattered electrons (BSE) -- ion milling -- lithium -- Monte Carlo modelling -- sputtering -- STEM
Microscopy -- Periodicals
502.82 - Journal URLs:
- http://www.blackwell-synergy.com/servlet/useragent?func=showIssues&code=jmi&close=1997#C1997 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1111/jmi.12591 ↗
- Languages:
- English
- ISSNs:
- 0022-2720
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5019.695000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 4795.xml