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HARVARD Citation
Ouamane, A. et al. (2017). A novel statistical and multiscale local binary feature for 2D and 3D face verification. Computers & electrical engineering. pp. 68-80. [Online].
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Ouamane, A. et al. (2017). A novel statistical and multiscale local binary feature for 2D and 3D face verification. Computers & electrical engineering. pp. 68-80. [Online].