Cite
HARVARD Citation
Ioannidis, E. et al. (2017). Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET. Solid-state electronics. pp. 1-7. [Online].
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Ioannidis, E. et al. (2017). Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET. Solid-state electronics. pp. 1-7. [Online].