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HARVARD Citation
Sung, P. et al. (2018). A low-level stress measurement method by integrating white light photoelasticity and spectrometry. Optics & laser technology. pp. 33-45. [Online].
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Sung, P. et al. (2018). A low-level stress measurement method by integrating white light photoelasticity and spectrometry. Optics & laser technology. pp. 33-45. [Online].