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HARVARD Citation
Zeng, Y. et al. (2017). Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered. Microelectronics and reliability. pp. 20-26. [Online].
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Zeng, Y. et al. (2017). Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered. Microelectronics and reliability. pp. 20-26. [Online].