Compton polarimetry using double-sided segmented x-ray detectors. (29th January 2015)

• Record Type: Journal Article
• Authors: Weber, G; Blumenhagen, K-H; Bräuning, H; Ding, H; Fritzsche, S; Hess, S; Märtin, R; Spillmann, U; Surzhykov, A; Trotsenko, S; Winters, D F A; Yerokhin, V A; Stöhlker, Th
• Is Part Of: Journal of physics. Number 583(2015)
• Page Start: 012041
• Publication Date: 2015-01-29
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/583/1/012041
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Hard x-ray polarimetry of radiation emitted in collisions of heavy ions, electrons or photons with matter provides detailed information on the collision dynamics as well as of the atomic structure in the presence of extreme field strengths. Moreover, it also opens a route for polarization diagnosis of spin-polarized ion and electron beams which, for example, might be useful in future parity non-conservation studies. Owing to recent progress in the development of highly segmented solid-state detectors, a novel type of polarimeter for the hard x-ray regime has become available. Applied as Compton polarimeters, two-dimensional position-sensitive x-ray detectors now allow for precise and efficient measurements of x-ray linear polarization properties. In this report recent polarimetry studies using such detector systems are reviewed.